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| Peng Tian, Herui Cui | ||
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| Falah Abodahir Athab, Wafaa Saeed Majeed | ||
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| E. Sreeshobha, P.V.N. Prasad | ||
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| Setiyo Budiyanto, Erman Al Hakim, Fajar Rahayu | ||
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| Shuthish Elangkovan, Mastura Shafinaz Zainal Abidin, Shaharin Fadzli Abd Rahman, Mohammad Shafiq Che Soh, Ahmad Bukhairi Md Rashid | ||
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| Hazwani Mohd Rosli, Syahirah Abd Halim, Lilik Jamilatul Awalin, Seri Mastura Mustaza | ||
| Vol 12, No 9: September 2014 | Edge Detection Based on Biomimetic Pattern Recognition | Abstract PDF |
| Ning Chen, Xiao-ping Song, Yi Liu | ||
| Vol 11, No 1: July 2018 | Edge detection Using Histogram Localization | Abstract PDF |
| Mohamed Asharudeen, Hema P Menon | ||
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| Ricardo Yauri, Rafael Espino | ||
| Vol 10, No 2: May 2018 | Edge Dissimilarity Reduced-Reference Quality Metric with Low Overhead Bitrate | Abstract PDF |
| Farah Diyana Abdul Rahman, Dimitris Agrafiotis, Ahmad Imran Ibrahim | ||
| Vol 14, No 1: April 2019 | Edge enhancement of IBP reconstruction by using sharp infinite symmetrical exponential filter | Abstract PDF |
| A.R. A Nazren, Ngadiran R., S. N. Yaakob | ||
| Vol 11, No 5: May 2013 | Edge Steganography for Binary Image | Abstract PDF |
| Hongxia Wang, Gouxi Chen, Meng Zhang | ||
| Vol 35, No 2: August 2024 | Edge-platforms based decision-support approach for solar panels inspection with YOLOv8 deep neural-network | Abstract PDF |
| Hajar El Karch, Abdelkader Mezouari, Youssef Natij, Rachid El Gouri | ||
| Vol 29, No 1: January 2023 | Editorial cloud collaborative service improves authorized industrial server database performance | Abstract PDF |
| Eswara Narayanan, Balasundaram Muthukumar | ||
| Vol 37, No 2: February 2025 | EDK-LEACH: improving LEACH protocol-based machine learning in wireless sensor networks | Abstract PDF |
| Taous Lechani, Samia Ourari, Fayçal Rahmoune, Said Amari, Hayet Termeche | ||
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Indonesian Journal of Electrical Engineering and Computer Science (IJEECS)
p-ISSN: 2502-4752, e-ISSN: 2502-4760
This journal is published by the Institute of Advanced Engineering and Science (IAES).