Alnatheer, Suleman, Prince Sattam bin Abdulaziz University, Saudi Arabia

• Vol 33, No 3: March 2024 - Electronics
  A novel approach for detecting sensor-based semiconductor fault yield classification using convolutional neural networks
  Abstract  PDF
• Vol 35, No 1: July 2024 - Electronics
  ADKNN fostered BIST with Namib Beetle optimization algorithm espoused BISR for SoC-based devices
  Abstract  PDF

This work is licensed under a Creative Commons Attribution-ShareAlike 4.0 International License.

The Indonesian Journal of Electrical Engineering and Computer Science (IJEECS)
p-ISSN: 2502-4752, e-ISSN: 2502-4760
This journal is published by the Institute of Advanced Engineering and Science (IAES) in collaboration with Intelektual Pustaka Media Utama (IPMU).

IJEECS visitor statistics