Shetty Janardhana, Shruthi, Nitte Meenakshi Institute of Technology, India
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Vol 33, No 2: February 2024 - Computer_and_Informatics
Convolutional neural network-based techniques and error level analysis for image tamper detection
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The Indonesian Journal of Electrical Engineering and Computer Science (IJEECS)
p-ISSN: 2502-4752, e-ISSN: 2502-4760
This journal is published by the Institute of Advanced Engineering and Science (IAES) in collaboration with Intelektual Pustaka Media Utama (IPMU).