Bouazza, B., University of Tlemcen, Algeria
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Vol 15, No 2: August 2015 - Electronics
Side Effects in a HEMT Performance with InAlN/GaN
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The Indonesian Journal of Electrical Engineering and Computer Science (IJEECS)
p-ISSN: 2502-4752, e-ISSN: 2502-4760
This journal is published by the Institute of Advanced Engineering and Science (IAES) in collaboration with Intelektual Pustaka Media Utama (IPMU).