Gaussian kernelized feature selection and improved multilayer perceptive deep learning classifier for software fault prediction

Sureka Sivavelu, Venkatesh Palanisamy

Abstract


Software fault prediction is the significant process of identifying the errors or defects or faults in a software product. But, accurate and timely detection is the major challenging issue in different existing approaches to predicting software defects. A novel Gaussian linear feature embedding-based statistical test piecewise multilayer perceptive deep learning classifier (GLFE-STPMPDLC) is introduced to improve software fault prediction accuracy and minimize time consumption. First, the input data are collected from the dataset. Next, the software metrics selection is carried out to select the significant metrics using Gaussian kernelized locally linear embedding with lesser software fault prediction. Then classification is carried out by Kaiser Meyer piecewise multilayer perceptive deep learning classifier for software fault prediction. The novelty of Kaiser–Meyer–Olkin (KMO) correlation test analyzes testing and training instances. The innovation of the Heaviside step activation function is applied for analyzing the KMO correlation test results and providing the final software fault prediction results. Finally, accurate fault prediction outcomes are achieved at the output layer with lesser error. Simulation of proposed GLFE-STPMPDLC technique achieves better 5%, 3%, 3% and 3% enhancement of fault prediction accuracy, precision, recall, and f-measure and 13% faster prediction time compared to conventional methods.

Keywords


Classification; Gaussian kernelized locally linear feature embedding; Heaviside step activation function; Kaiser–Meyer–Olkin correlation test; Multilayer perceptive deep learning classifier; Software fault prediction

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DOI: http://doi.org/10.11591/ijeecs.v30.i3.pp1534-1547

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Indonesian Journal of Electrical Engineering and Computer Science (IJEECS)
p-ISSN: 2502-4752, e-ISSN: 2502-4760
This journal is published by the Institute of Advanced Engineering and Science (IAES) in collaboration with Intelektual Pustaka Media Utama (IPMU).

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