Efficient model for cotton plant health monitoring via YOLO-based disease prediction
Aruna Pavate, Swetta Kukreja, Surekha Janrao, Sandip Bankar, Rohini Patil, Vijaykumar Bidve
Abstract
Protecting plants from diseases involves recognizing the symptoms and identifying practical, safe, and reasonable treatment methods. Holistic approaches based on particular times or seasons can reduce plant resistance and minimize tedious work. Technological advancements have led to the development of microscopic examinations and computational methods using machine learning techniques to detect diseases automatically and quickly using leaf images. This study builds the prediction model using EfficientNet and YOLO neural network architectures from computer vision. The development of a model that assists farmers in identifying cotton disease so that they use pesticides that may treat it further utilizes this concept. In the physical world, the input is accepted from many different sources, so observing the model’s output is necessary. This work concentrates on model response to the inputs from physical devices, and analysis shows that the monitoring varies the results. A novel convolutional neural network (CNN) based on the EfficientNet architectures and variations of YOLO architectures is used to classify and identify the objects in cotton leaf. The EfficientNetB4 yielded 100% accuracy for healthy leaf and powdery mild leaf classes, and YOLO v4 version with 96%, 98.3%, 99.2%, and 0.70 for precision, recall, mAP@0.5, mAP120.5:095 respectively. These results indicate that consequences vary in real-time per environmental parameters such as light effect and devices, and analysis shows that monitoring affects the results.
Keywords
Computer vision; Cotton plant; Deep learning; Real time crop monitoring; Object detection
DOI:
http://doi.org/10.11591/ijeecs.v37.i1.pp164-178
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Indonesian Journal of Electrical Engineering and Computer Science (IJEECS)
p-ISSN: 2502-4752, e-ISSN: 2502-4760
This journal is published by the Institute of Advanced Engineering and Science (IAES) in collaboration with Intelektual Pustaka Media Utama (IPMU).
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