Android malware detection using GIST based machine learning and deep learning techniques

Ponnuswamy Udayakumar, Srilatha Yalamati, Lavadiya Mohan, Mohd Junedul Haque, Gaurav Narkhede, Krishna Mohan Bhashyam


In today’s digital world, Android phones play a vital part in a variety of facets of both professionals and individuals’ personal and professional lives. Android phones are great for getting things done faster and more organized. The proportionate increase in the number of malicious applications has also been seen to be expanding. Since the play store offers millions of apps, detection of malware apps is challenging task. In this paper, a methodology is introduced for detecting malware in Android applications through the utilization of global image shape transform (GIST) features extracted from grayscale images of the applications. The dataset comprises samples of both malware and benign apps collected from the virus share website. After converting the apps into grayscale images, GIST features are extracted to capture their global spatial layout. Various machine learning (ML) algorithms, such as logistic regression (LR), k-nearest neighbour (KNN), AdaBoost, decision tree (DT), Naïve Bayes (NB), random forest (RF), support vector machine (SVM), extra tree classifier (ETC), and gradient boosting (GB), are employed to classify the applications according to their GIST features. Furthermore, a feed forward neural network (FFNN) is utilized as a deep learning (DL) technique to further improve the accuracy of classification. The performance of each algorithm is evaluated using metrics such as accuracy, precision and recall. The results demonstrated that the FFNN achieves superior accuracy compared to traditional ML classifiers, indicating its effectiveness in detecting malware in Android apps.


Android; Deep learning; GIST; Machine learning; Malware detection

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The Indonesian Journal of Electrical Engineering and Computer Science (IJEECS)
p-ISSN: 2502-4752, e-ISSN: 2502-4760
This journal is published by the Institute of Advanced Engineering and Science (IAES) in collaboration with Intelektual Pustaka Media Utama (IPMU).

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