Integrated electronic system for FET biosensor assessment based on current-voltage curve tracing

Achmad Arif Bryantono, Leonardo Kamajaya, Fitri Fitri, Sungkono Sungkono, Herwandi Herwandi, Agwin Fahmi Fahanani

Abstract


Field-effect transistor (FET) biosensors are pivotal in diverse applications, from environmental monitoring to healthcare diagnostics. Current-voltage (I-V) curve tracing is a powerful method for evaluating FET biosensor behavior, enabling comprehensive analysis of their FET biosensor characteristics. Traditional I-V curve tracing methods often require complex and expensive equipment, limiting their accessibility and practicality for routine sensor assessment. This study aims to develop and demonstrate an integrated electronic system for assessing FET biosensors using I-V curve tracing. The integrated electronic system uses readily available components, including microcontrollers, analog circuitry, and user-friendly software. We developed a compact, low-cost device that generates I-V curves for the FET biosensor. The integrated electronic system successfully generated I-V curves for various FET biosensors. The system demonstrated consistent, reliable performance, portability, and ease of use, making it a practical solution for routine sensor assessment. The average error in measurements using bipolar junction transistors (BJT) and metal-oxide-semiconductor field-effect transistors (MOSFETs) results in 2.62%, and measurements at different pH levels have a sensitivity of 21.6 mV/pH and a linearity of 0.9892. This innovation contributes to the advancement of FET biosensor technology. In the future, the developments should focus on ensuring their accuracy and reliability in various sensor fields.

Keywords


Data acquisition; FET biosensor measurement; Integrated electronic system; I-V curve tracer; Source measure unit

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DOI: http://doi.org/10.11591/ijeecs.v34.i3.pp1463-1471

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Indonesian Journal of Electrical Engineering and Computer Science (IJEECS)
p-ISSN: 2502-4752, e-ISSN: 2502-4760
This journal is published by the Institute of Advanced Engineering and Science (IAES) in collaboration with Intelektual Pustaka Media Utama (IPMU).

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