Wang, Yu, HOHAI University, Nanjing, China
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Vol 11, No 1: January 2013 - Special_Invitation
A Prioritized Test Generation Method For Pair-wise Testing
Abstract PDF
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The Indonesian Journal of Electrical Engineering and Computer Science (IJEECS)
p-ISSN: 2502-4752, e-ISSN: 2502-4760
This journal is published by the Institute of Advanced Engineering and Science (IAES) in collaboration with Intelektual Pustaka Media Utama (IPMU).