Guen-Bouazza, A., Abou Bekr Belkaid University, Algeria
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Vol 12, No 4: April 2014 - Special_Invitation
3D Simulation of Fin Geometry influence on Corner effect in Multiļ¬n Dual and Tri-gate SOI-FinFETs
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The Indonesian Journal of Electrical Engineering and Computer Science (IJEECS)
p-ISSN: 2502-4752, e-ISSN: 2502-4760
This journal is published by the Institute of Advanced Engineering and Science (IAES) in collaboration with Intelektual Pustaka Media Utama (IPMU).